The AX1018 test system leverages from PXI and AXIe technologies to provide high end semiconductor ATE performance in a compact,
low-cost, industry standards based form factor.
With support for a wide range of digital, analog, and RF instrumentation, the AX1018 is perfectly suited for post-silicon validation and characterization, as well as multi-site production test of consumer digital and wireless devices. Low latency, high speed PCI/PCIeinfrastructure, combined with industry leading settling times, give the AX518 exceptionally fast test times and high parallel test efficiency.
The system is designed with easily interchangeable device load boards using high density direct AXIe and mixed-signal and blind mate RF connections. Manipulator mounts and docking plate compatibility coupled with a full suite of production software tools facilitate smooth deployment into high volume production. The PXI/AXIe foundation of the AX1018 provides a unique combination of high end ATE performance with the economics and investment protection that come with widely deployed industry standards based instruments.
|AX518 Integrated 5 Slot AXIe/18 Slot PXI System Data Sheet
|AX1018 Integrated 10 Slot AXIe/18 Slot PXI System Data Sheet