Keithley's SourceMeter family is designed specifically for test applications that demand tightly coupled sourcing and measurement. All source-measure models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter instrument is both a highly stable DC power source and a true instrument-grade 5-1/2 digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the source-measure instruments invaluable for a wide range of characterization and production test applications.
Model 2410-C High Voltage SourceMeter® is a 20W instrument that sources and measures voltage from ±5µV (source) and ±1µV (measure) to ±1100V and current from ±10pA to ±1A. With its higher voltage sourcing range, the Model 2410-C is an excellent choice for resistors and voltage coefficient testing, varistors, and high voltage diodes, including switching, zener, RF diodes, and rectifiers. The Model 2410-C is able to measure 20mA while sourcing 1100V, providing the extra resolution needed for precision testing of these devices. The Contact Check function makes it simple to maximize test integrity by verifying test connections easily in just 350µs before an automated test sequence begins. This eliminates measurement errors and false product failures associated with contact fatigue, breakage, contamination, loose or broken connection, relay failures, etc.
Model 2410-C의 주요기능
Completes the contact check verification and notification process in just 350µs to maintain high speed production throughput
Contact Check enabled on the instrument's front panel or remotely via the GPIB
Built-in "Source Memory" programmable sequencer stores up to 100 different tests for high production throughput
Rugged design with 75,000-hour MTBF provides reliability in non-stop production environments.
Built-in comparator simplifies pass/fail testing
Digital I/O for fast binning or connection to component handlers
0.012% basic accuracy with 5-1/2-digit resolution for precise measurements