Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-2600-RTM is an option to ACS that leverages the measurement speed and system integration capabilities of Keithley's Series 2600B System SourceMeter® SMU instruments. The result–you can produce lifetime predictions from two to five times faster than you can with conventional WLR test solutions, allowing you to accelerate your technology development, process integration, and process monitoring for faster time to market.
Model ACS-2600-RTM의 주요기능
Leverages unique strengths of Keithley Series 2600B System SourceMeter® SMU instruments including system scalability and measurement speed
System configurations from 2 to 44 channels
Comprehensive JEDEC-compliant test suite
Optimized for both emerging and mature technologies
Supports both sequential and parallel testing
Fully automatic single-site and multi-site capability